Springer, 2007. — 207 p.
Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.
Future Trend of Science and Technology in 21st Century
Scanning Tunneling Microscope (STM)
Atomic Force Microscope (AFM)
Near Field Optical Microscope
Scanning Capacitance Microscope
Electrostatic Force Microscope
Magnetic Force Microscope
STM Radiation and Spectroscopy
Scanning Atom Probe
Chemical Discrimination of Atoms and Molecules
Manipulation of Atoms and Molecules
Multi-Probe SPM
AFM Measurement in Solution
High-Speed SPM
Scanning Nonlinear Dielectric Microscope
SPM Coupled with External Fields
Spin Measurement
Probe Technologies
SPM Characterization of Magnetic Materials
SPM Characterization of Semiconducting Materials
SPM Characterization of LSI Devices
SPM Characterization of Catalyst
SPM Characterization of Biomaterials
SPM Characterization of Organic Matter and High Polymer
Theory of SPM
Round-Table Talk on SPM Roadmap