Springer, 2008. — 411 p.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Test and Defect Tolerance for Crossbar-Based Architectures.Defect-tolerant Logic with Nanoscale Crossbar Circuits
Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics
Test and Defect Tolerance for Reconfigurable Nanoscale Devices
A Built-In Self-Test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology
Defect Tolerance in Crossbar Array Nano-Architectures
Test and Defect Tolerance for QCA CircuitsReversible and Testable Circuits for Molecular QCA Design
Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems
QCA Circuits for Robust Coplanar Crossing
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata
Testing Microfluidic Biochips.
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems
Reliability for Nantechnology DevicesDesigning Nanoscale Logic Circuits Based on Markov Random Fields
Towards Nanoelectronics Processor Architectures
Design and Analysis of Fault-tolerant Molecular Computing Systems.